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The group provides comprehensive facilities for TEM, SEM and ESEM.
Transmission Electron Microscopy:
The transmission electron microscope is used to determine the internal structure of inorganic, organic and biological materials. Materials for transmission electron microscopes must be prepared in a form which allows the electrons to transmit through the whole sample, similar like light is transmitted through materials in a conventional optical microscope. As the wavelength of electrons is much shorter than that of light, the resolution attainable in a transmission electron microscope is some orders of magnitude better than that from a light microscope. As a consequence, transmission electron microscopes can reveal the finest details of internal structure. In our group there is one transmission electron microscope.
EFTEM Omega 912 (Zeiss AG):
Features
- Fully computer controlled transmission electron microscope with an OMEGA-type (LEO patent) in-column energy-filter
- Lateral resolution: 0.37 nm
- Point resolution: 0.34 nm
- Accelerating voltage: 60-120 kV
- Magnification: 80-500000x
- Electron energy loss spectroscopy (EELS)
- BF/DF measurements
- Image analysis program (Soft Imaging System)
- LaB6 cathode
- CCD-camera (2k x 2k)
Scanning Electron Microscopy:
The scanning electron microscope is one of the most versatile and widely used tools of modern science as it allows the study of both surface morphology and composition of inorganic, organic and biological materials.
High-resolution SEM Gemini 1550 (Zeiss AG):
LEO 1550 Field Emission SEM with unique Gemini column for high resolution imaging.
- fully computer controlled transmission electron microscope with an OMEGA-type (LEO patent) in-column energy-filter
- Resolution at 1 kV: 3 nm
- Resolution at 20 kV: 1 nm
- Accelerating voltage: 0.2 to 30 kV
- Magnification: 20-900000x
- In-Lens Detector
- Probe current: 4 pA to 10 nA
- Electron Gun: Thermal field emission type
- Specimen Stage Type: Cartesian Movements: X = 100 mm, Y = 125 mm, Z = 34 mm
- Rotation: 360 degrees continuous
- Image Display 17” Super VGA
- Image Processing: Pixel averaging, frame integration, continuous averaging
Environmental SEM Quanta FEG 600 (FEI Company)
Features
- High-resolution Field Emission-SEM
- Column optimized for high brightness/high current
- Resolution: High-vacuum mode
- at 1 kV: 3 nm (SE)
- at 30 kV: 1.2 nm (SE)
- Resolution: Low-vacuum mode
- at 3 kV: 3 nm (SE)
- at 30 kV: 1.5 nm (SE)
- Resolution: Extended vacuum mode (ESEM)
- Accelerating voltage: 0.2 to 30 kV
- Probe current: up to 100 nA continuously adjustable
- Everhardt-Thornley SED
- Low-vacuum SED
- IR-CCD
- Solid-state BSED
- High-vacuum: 0.0006 Pa
- Low-vacuum: 10 to 130 Pa
- Pseudo-eucentric goniometer stage
- Cartesian Movements: X = 150 mm, Y = 150 mm, Z = 65 mm
- Rotation: 360 degrees continuous
Energy dispersive X-ray analysis
The interaction of electrons with the sample produces x-rays which are characteristic of the elements inside the material. A DSM 940 (Zeiss AG) scanning electron microscope is fitted with a micro-analytical system (Link ISIS System, Oxford Instruments) which analyzes these x-rays and allows the determination of the local composition. The energy dispersive x-ray analysis system allows the detection of elements from Carbon upwards.
Link ISIS System (Oxford Instruments)
Features
- Si(Li) SATW-Detector
- Detection of elements with Z>5
- Guaranteed Resolution: 133 eV
- Active crystal area: 10 mm2
- Cooling system: liquid nitrogen (7.5 L Dewar)
- Liquid nitrogen alarm system
- Thermal cycling
- Ice removal
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