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Journal Article (1)

1996
Journal Article
Harke, M.; Stelzle, M.; Motschmann, H. R.: Microscopic ellipsometry: Imaging monolayer on arbitrary reflecting supports. Thin Solid Films 284/285, pp. 412 - 416 (1996)

Conference Paper (1)

1997
Conference Paper
Stelzle, M.; Tuchtenhagen, J.; Rabolt, J. F.: Novel all-fibre-optic Fourier-transform spectrometer with thermally scanned interferometer. Progress in Fourier Transform Spectroscopy, 10th International Conference, Budapest, August 27, 1995 - September 01, 1995. Mikrochimica Acta Supplement 14, pp. 785 - 787 (1997)
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