Journal Article
Sezer, M.; Feng, J. J.; Ly, H. K.; Shen, Y. F.; Nakanishi, T.; Kuhlmann, U.; Hildebrandt, P.; Möhwald, H.; Weidinger, I. M.: Multi-layer electron transfer across nanostructured Ag-SAM-Au-SAM junctions probed by surface enhanced Raman spectroscopy. Physical Chemistry Chemical Physics
12 (33), pp. 9822 - 9829 (2010)