Journal Article
Zemke, F.; Scoppola, E.; Simon, U.; Bekheet, M. F.; Wagermaier, W.; Gurlo, A.: Springback effect of ambient-pressure-dried silica aerogels: nanoscopic effects of silylation revealed by in situ synchrotron X-ray scattering. Nanoscale Advances
6 (1), pp. 111 - 125 (2024)