Double aberration-corrected high-resolution scanning transmission electron microscope Jeol JEM-ARM200F

Specification:

  • Cold Field Emission Gun
  • Accelerating voltages: 60, 80 & 200 kV
  • Magnifications in TEM mode: 50-2000000x
  • Magnifications in STEM mode: 200-150000000x
  • TEM lateral resolution at 200kV: 0.07 nm
  • TEM point to point  resolution at 200kV: 0.10 nm
  • STEM BF image resolution at 200kV: 0.14 nm
  • STEM HAADF image resolution at 200kV: 0.10 nm
  • Probe (STEM)-Cs-Corrector; Image (TEM)-Cs-Corrector
  • JED-2300 Energy-dispersive X-ray detector, 100mm2
  • Gatan GIF Quantum
  • Gatan OneView (4k x 4k) & Gatan US1000 (2k x 2k) cameras.

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